ANALYSIS OF V-CHECK DEFECTS IN THE FINAL INSPECTION PROCESS

dc.contributor.advisorOctowinandi, Vivin
dc.contributor.authorDanuarta, Reza
dc.date.accessioned2026-07-30T03:27:23Z
dc.date.issued2026-07-29
dc.description.abstractThe Final Inspection process plays a critical role in ensuring that electronic components meet quality standards before shipment. At PT Panasonic Industrial Devices Batam, Camera 7 frequently generated false defect detections during the V-check inspection process, resulting in unnecessary product rejection and reduced inspection efficiency. This study aims to identify the root causes of V-check defects and evaluate the effectiveness of corrective actions in improving inspection performance. A combination of qualitative and quantitative approaches was employed through direct observation, historical production data analysis, Fishbone Diagram, Root Cause Analysis (RCA), and inspection performance evaluation. The analysis identified inappropriate camera parameter settings and unstable lighting conditions as the primary causes of false defect detection. Corrective actions included product code registration, camera parameter optimization, camera recalibration, and the installation of a black cover to improve lighting stability. Experimental results showed that inspection accuracy increased from 78% to 95% after register code optimization and from 77% to 93% after lighting improvement. In addition, the number of V-check defects decreased from 14,246 to 5,252 units in the first experiment and from 13,800 to 3,011 units in the second experiment. Furthermore, the Defect Performance Rate decreased from 97.2% to 77.2% and from 88.8% to 69.8%, indicating a significant reduction in false defect occurrences after implementing the proposed corrective actions. These findings demonstrate that optimizing camera parameters and lighting conditions effectively improves inspection reliability, minimizes false defect detection, and enhances the overall stability of the Final Inspection process.
dc.identifier.citationIEEE
dc.identifier.kodeprodiKODEPRODI20406#Teknik Elektronika Manufaktur
dc.identifier.nidnNIDN0030108305
dc.identifier.nimNIM3222311002
dc.identifier.urihttps://repository.polibatam.ac.id//handle/PL29/4841
dc.language.isoen
dc.publisherPoliteknik Negeri Batam
dc.subjectFinal Inspection
dc.subjectMachine Vision
dc.subjectV-check Defect
dc.subjectRoot Cause Analysis
dc.subjectFishbone Diagram
dc.subjectDefect Performance Rate.
dc.titleANALYSIS OF V-CHECK DEFECTS IN THE FINAL INSPECTION PROCESS
dc.typeArticle

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