Handling Coplanarity and Bent Lead Issues of IC Units During Testing Process on Rasco Machine

Abstract

In the semiconductor manufacturing industry, the quality of integrated circuits (ICs) is critical to product competitiveness, which makes optimal IC testing essential. Coplanarity problems and bent leads often occur during IC testing using Rasco machines due to suboptimal maintenance. This study evaluates the implementation of preventive and routine maintenance to mitigate these issues. The methods include collecting historical failure data and implementing preventive and routine maintenance schedules on Rasco machines. The results show that preventive and routine maintenance significantly reduce the number of ICs with coplanarity and bent lead issues. The number of ICs with coplanarity issues decreased from approximately 5,429 (17.5%) to 25,566, and the number of ICs with bent lead issues decreased from approximately 8,146 (22.3%) to 28,348. Additionally, these methods improve operational efficiency and product quality stability. This study underscores the importance of a proactive approach to machine maintenance for supporting quality and productivity in the semiconductor industry.