Failure Analysis of IC (Econo) Modules in Dynamic,Static, and ISO Process

dc.contributor.advisorArifin,Muhammad
dc.contributor.authorAlfath,Ridho Muhammad
dc.date.accessioned2025-01-03T09:21:12Z
dc.date.issued2024-05-02
dc.description.abstractDynamic, Static, and ISO are adapters that are useful for testing modules on the machine. In this system, Dynamic, Static, and ISO have their respective roles in the testing machine with the process of using a KWK 4-type machine. This research aims to analyze the frequent module rejects that occur in dynamic, static, and ISO. The analysis method used in this research is qualitative analysis. This type of research uses a qualitative descriptive approach, which describes and analyzes the problems found. Keyword: Adapter, ISO, Dynamic, Static
dc.identifier.citationJAEE
dc.identifier.kodeprodiKODEPRODI005029#Teknik_Elektronika_Manufaktur
dc.identifier.nidnNIDN0020068902
dc.identifier.nimNIM3222101027
dc.identifier.urihttp://103.209.1.147:4000/handle/PL029/3085
dc.language.isoen
dc.subjectTECHNOLOGY::Electrical engineering, electronics and photonics::Electronics
dc.subjectTECHNOLOGY::Industrial engineering and economy::Manufacturing engineering and work sciences::Manufacturing engineering
dc.subjectTECHNOLOGY::Chemical engineering::Chemical process and manufacturing engineering
dc.titleFailure Analysis of IC (Econo) Modules in Dynamic,Static, and ISO Process
dc.typeArticle

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