Deteksi Wafer Menggunakan YO-LO Berbasis Barcode
Repository Politeknik Negeri Batam
Date
2025-04-30
Authors
Bella Nur Azizah Bella Nur Azizah
Harry Gunawan Harry Gunawan
Journal Title
Journal ISSN
Volume Title
Publisher
Juritek
Abstract
Wafer or chip is the main component in the IC Packaging process, so it should be well
maintained. Wafer storage also greatly affects the condition of the wafer. Wafers will be stored in a
special cabinet that is given a Nitrogen spray (N2 Cabinet), Nitrogen is useful for preventing damage
to the wafer such as corrosion, discoloration and contamination. Inside the N2 cabinet can contain 16
cassettes and 1 cassette can contain as many as 25 wafers. The many projects being carried out cause a
buildup of wafers stored in the N2 cabinet, this condition makes it difficult for Engineers or
Technicians to find wafers. One of the factors causing the buildup is due to the mixing of expired
wafers and new wafers. The author tries to create a device to help provide a solution to the anxiety
experienced. A camera that functions to read the barcode on the wafer in order to read the wafer lot
ID in the cassette, YO-LO as a processor of the reading results from the camera to be configured with
the mongo DB database that was previously manually keyed in by the user for wafer data details, then
the results of the information data will be displayed on the website. Based on the test results that have
been carried out as many as 70 times, the barcode shortening results and wafer data details can be
displayed on the web in real time.
Description
Keywords
Wafer, YO-LO, Mongo DB, Website
Citation
LPKD