D4 Teknik Mekatronika

Permanent URI for this collectionhttps://repository.polibatam.ac.id/handle/PL029/1764

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  • Repository Politeknik Negeri Batam
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    Deteksi Wafer Menggunakan YO-LO Berbasis Barcode
    (Juritek, 2025-04-30) Bella Nur Azizah Bella Nur Azizah; Harry Gunawan Harry Gunawan; Jefiza,Adlian
    Wafer or chip is the main component in the IC Packaging process, so it should be well maintained. Wafer storage also greatly affects the condition of the wafer. Wafers will be stored in a special cabinet that is given a Nitrogen spray (N2 Cabinet), Nitrogen is useful for preventing damage to the wafer such as corrosion, discoloration and contamination. Inside the N2 cabinet can contain 16 cassettes and 1 cassette can contain as many as 25 wafers. The many projects being carried out cause a buildup of wafers stored in the N2 cabinet, this condition makes it difficult for Engineers or Technicians to find wafers. One of the factors causing the buildup is due to the mixing of expired wafers and new wafers. The author tries to create a device to help provide a solution to the anxiety experienced. A camera that functions to read the barcode on the wafer in order to read the wafer lot ID in the cassette, YO-LO as a processor of the reading results from the camera to be configured with the mongo DB database that was previously manually keyed in by the user for wafer data details, then the results of the information data will be displayed on the website. Based on the test results that have been carried out as many as 70 times, the barcode shortening results and wafer data details can be displayed on the web in real time.