D3 Teknik Elektronika Manufaktur

Permanent URI for this collectionhttps://repository.polibatam.ac.id/handle/PL029/1759

Browse

Search Results

Now showing 1 - 10 of 22

Analysis of Defect Issues in Wire Bond ASM I Hawk Extreme 099 Before-After Preventive Maintenance(PM)
(Politeknik Negeri Batam, 2023-07-11) Permadhi, Dede Gading; Prebianto, Nanta Fakih; ; Wijanarko, Heru
Non-stick on pad (NSOP) is a defect that falls under the defect category and is very problematic to the manufacturing process because it can cause the production machine to stop working immediately and prevent the material from being reused or removed. The production schedule was thrown off when NSOP issues appeared. This causes a lot of unplanned downtime and may cause it to exceed the management of the company's recommended range. The IHAWK Extreme 099 ASM machine was studied by the authors utilizing the fishbone method, where the fishbone itself is highly useful in determining the reason of errors that occur besides that the author also uses DOE (Design of Experiment) to find the best parameters use. Find causes of NSOP is the goal of this study, defects on the machine minimize the possibility that NSOP defects will develop on the machine, and increase the machine's output. The results of the research are get 1 good parameter to use in production line, there is use 116 DAC (Digital analog Convert) for the Bond Power Parameters, use 35 gf for the Bond Force Parameter. After this parameters implemented during production running, the number of occurrences of NSOP issues can be reduced to 42%.
Analysis of Lifted Stitch Defect on EconoPack4 Module in Wire Bonding Process
(2024-07-02) M,Anjunius; Puspita,Widya Rika
A Lifted Stitch Defect is a wire that becomes disconnected or detached from the desired bonding location, typically a bonding pad on an IC (Integrated Circuit) or substrate. This issue presents a persistent challenge in the semiconductor module during the wire bonding process, thereby affecting the quality of semiconductor products. This research employs a structured approach to identify and eliminate these defects. Diagram charts, Data Collection, and Fishbone Diagram analysis are utilized to systematically uncover the root causes and enhance the quality of the semiconductor module. The applied corrective measures resulted in a 96.75% reduction in lifted stitch defects, demonstrating the effectiveness of this methodology. This research can lead to continuous improvements in the wire bonding process, ensuring increased product quality and reliability.
Econo Product Quality Analysis
(2024-05-07) Luaha,Yohanes Melka Jaya; Arifin, Muhammad
The quality of semiconductor products has a big role in supporting the development of modern technology. Econo Products Low and Medium Power modules, Econo Products can helptechnological developments. This research aims to explore the concept of product quality in the context of the semiconductor industry, analyzing the factors that influence quality andcreating good quality results.
PERFORMANCE RATE DATA ANALYSIS OF OEE BY DATA RECORD SYSTEM MODIFICATION IN FINAL INSPECTION MACHINE
(2024-06-14) Firdaus, Muhammad; Prebianto, Nanta Fakih
The role of machinery is crucial in production to keep it optimized. The capacitor manufacturing process consists of assembly and final inspection. Analysis of the final inspection improvement shows that the decline in machine performance is caused by the repetition of inspection which causes lost time and affects the daily production time. The cause of detection errors is unpredictable and still unknown. This research measures the performance of machines in the manufacturing industry with the Overall Equipment Effectiveness (OEE) method and uses 7QC tools such as fishbone and flow charts. After the project was completed, it was found that the decline in the performance of the final inspection machine was due to a lack of focus in the analysis. The limited data after the final lot made it difficult to determine cameras with high inspection errors because inspection repetition data was not recorded. In this study, data from 10 manual inspection lots on each machine were taken, the average impact of re inspection was 14.1%, and the average performance after re-inspection was 81.6%. Camera 3 has the highest number of defects at 34% and camera 4 at 29%. The higher the number of camera defects, the greater the performance degradation in the inspection process.
Analysis of Tear and Service Life on Capillary Process Framebond Machine HK 133
(2024-07-06) Fauzan,Muhammad Al; Maulidiah,Hana Mutialif
The Capillary Bonding process is an important method in the assembly of semiconductor components that involves joining with the use of adhesive materials. The capillary is one of the main components along with the blade contained in a wire bonding machine system. Wire bonding machine system with a process using the HK-133 type which can affect productivity in the bonding process. Productivity in the bonding process. This study aims to analysis the frequent occurrence of rejects caused by calibration limits which include blade and capillary replacement. The analysis method used in this research is qualitative analysis. This type of research uses a qualitative descriptive approach, namely describe and analysis the problems, The research shows that every calibration and capillary limit that has been replaced will have an impact on good results, as well as increase productivity on the machine framebond HK 133.
Analysis Defect of the Econo PIM 3 Module in the Endtest Process (KWK 4)
(2024-06-14) Siregar, Willi Prayogi; Wikanta, Prasaja
The Econo PIM 3 Module is one of the module Processed through KWK 4 Machine in the Endtest Process Area. This module has a defect called Bent Pin and Burn Pin, so this research was prepared to find out the causes of the problems that occur and make improvements to prevent the occurence of these defects.
Analysis of Lifted Metal Defect Improvement at Wire Bond Process for Imotion Device
(2024-07-24) Susanto, Nada Rindiani; Prebianto, Nanta Fakih
In the process of making IC (Integrated Circuit) through many processes, one of which is the wire bond process. The perfection of a product is a big reason to fulfill customer desires. Therefore, every product must be seen for its quality so that the product is perfect and there are no product defects in it. The wire bond process has many defects, one of which is the lifted metal defect. In this final project, researchers will discuss the improvement of lifted metal defects in the wire bond process which aims to develop or improve products so that defects do not occur again. In addition, researchers will also look for the root cause analysis of lifted metal through the parameters used in the wire bond process and find out the right parameters to reduce the occurrence of lifted metal defects. From the analysis obtained, researchers hope to find the right parameters to develop or improve the occurrence of lifted metal. Keywords: Integrated Circuit, Wire Bond, Defect Lifted Metal, Root Cause Analysis
Failure Analysis of IC (Econo) Modules in Dynamic,Static, and ISO Process
(2024-05-02) Alfath,Ridho Muhammad; Arifin,Muhammad
Dynamic, Static, and ISO are adapters that are useful for testing modules on the machine. In this system, Dynamic, Static, and ISO have their respective roles in the testing machine with the process of using a KWK 4-type machine. This research aims to analyze the frequent module rejects that occur in dynamic, static, and ISO. The analysis method used in this research is qualitative analysis. This type of research uses a qualitative descriptive approach, which describes and analyzes the problems found. Keyword: Adapter, ISO, Dynamic, Static
Analysis Defect Insufficient Solder J2 on PCBA Model CG200-20244-004
(2024-07-23) Sembiring, Hanna Febriana Kirana Br; Octowinandi, Vivin
Insufficient Solder is a condition where there is not enough solder so that the solder is not able to form a good joint. In the production process of PCBA CG200-20244-004, there was an insufficient solder defect at the J2 location. This study aims to analyze the causes of insufficient solder defects using fishbone diagram. After the analysis, the author concluded that the insufficient solder defect occurred due to material factors, namely the thickness of the stencil not able to cover the coplanarity lead component. The stencil thickness used in this model is 3.5 mils or 0.089mm, but based on the results of the coplanarity measurement, there are several components with a coplanarity close to 0.089mm so that the stencil thickness is not able to cover the lead of component. One way to prevent defects from happening again is to increase the thickness of a special stencil at the J2 location from 3.5 mils to 5 mils. With the increase stencil thickness, the solder paste printing results also increase so that it is able to cover the coplanarity of the component.
Analysis of the Defect's Causes Not Complete Soldering on Reflow Oven Machine using RCA Techniques
(2024-06-24) AMELIA; Nakul,Fitriyanti
The efficiency of the production process against not complete soldering defects encourages the application of Quality by control strategy for semiconductor components in the form of DCB modules as a scientific approach based on the application of quality risk in semiconductor component product development. This article aims to provide knowledge about the root cause analysis method that can be used in risk management for problems that occur in the manufacturing industry. The results of the article review of root cause analysis methods, such as Pareto Analysis, Fishbone Diagram, 5Whys, Failure Mode and Effect Analysis, can be used to find the root cause of a problem with differences in each method in terms of stages, analysis and risk assessment. The benefit of this article is that every company can make improvements to the crucial factors that trigger the not complete soldering defect and prevent and even solve this defect so that the company gets low costs and large profits.

D3 Teknik Elektronika Manufaktur

Browse

Filters

Settings

Sort By

Results per page

Search Results